Organizer and Committee


International Advisory Board


Alain Blouin                     
National Research Council of Canada, Canada
Bertrand Audoin University Bordeaux 1, France
Christophe Bescond    
National Research Council of Canada, Canada
Makoto Ochiai     
Toshiba, Japan
Matt Clark   
University of Nottingham, UK
Oluwaseyi Balogun     
Northwestern University, USA
Peter Burgholzer     
RECENDT Research Center for Non Destructive Testing, Austria
Shuyi Zhang
Nanjing University, China


International Scientific Committee


Bertrand Audoin               
University Bordeaux 1, France
Andrey Akimov 
University of Nottingham, UK
Oluwaseyi Balogun 
Northwestern University, USA
Paul C.Beard 
University College London, UK
Laurent Belliard
Sorbonne Université, France
Thomas Berer
RECENDT Research Center for Non Destructive Testing, Austria
Christophe Bescond
National Research Council of Canada, Canada
Shiro Biwa
Kyoto University, Japan
Alain Blouin
National Research Council of Canada, Canada
Emmanuel Bossy
University Grenoble Alpes, France
Peter Burgholzer
RECENDT Research Center for Non Destructive Testing, Austria
Qian Cheng Tongji University, China
Matt Clark
University of Nottingham, UK
Steve Dixon
University of Warwick, UK
Rachel Edwards
University of Warwick, UK
Christ Glorieux 
Catholic University of Leuven, Belgium
Vitalyi Gusev
Le Mans Université, France
Peter Hess
Heidelberg University, Germany
David Hurley
ldaho National Laboratories, USA
Kyung-Young Jhang
Hanyang University, Korea
Huabei Jiang
University of South Florida, USA
Alexander A. Karabutov
Moscow State University, Russia
Sridhar Krishnaswamy
Northwestern University, USA
Osamu Matsuda 
Hokkaido University, Japan
Humphrey Maris
Brown University, USA
Alexei Maznev
Massachusetts Institute of Technology, USA
Todd Murray
University of Colorado, USA
Makoto Ochiai
Toshiba, Japan
Hirotsugu Ogi 
Osaka University, Japan
lvan Pelivanov
University of Washington, USA
Tomaz Pozar
University of Ljubljana, Slovenia
Claire Prada
Institute Langevine, France
Samuel Raetz
Le Mans Université, France
Bernhard Reitinger
RECENDT Research Center for Non-Destructive Testing, Austria
Zhongqing Su The Hongkong Polytechnic Uinversity, China
Zhonghua Shen
Nanjing University of Science and Technology, China
Theodosia Stratoudaki
University of Strathclyde, UK
Chao Tao
Nanjing University, China
Chao Tian
Chinese University of Science and Technology, China
lstvan A.Veres
RECENDT Research Center for Non -Destructive Testing, Austria
Oliver B.Wright
Hokkaido University, Japan
Shuyi Zhang
Nanjing University, China




Organizing Committee


CHAIR    

Zhonghua Shen         
Nanjing University of Science and Technology, China
MEMBERS

Chenyin Ni
Nanjing University of Science and Technology, China
Ling Yuan
Nanjing University of Science and Technology, China
Weiwei Kan
Nanjing University of Science and Technology, China
Siyu Liu
Nanjing University of Science and Technology, China
Hongchao Zhang 
Nanjing University of Science and Technology, China
Yunxiang Pan
Nanjing University of Science and Technology, China
Jian Lu
Nanjing University of Science and Technology, China
Jichuan Xiong
Nanjing University of Science and Technology, China
Zewen Li
Nanjing University of Science and Technology, China
Vitalyi Gusev
Le Mans Université, France
Alexey M.Lomonosov

Russian Academy of Sciences, Russia

Chao Tao
Nanjing University, China
Xiaodong Xu
Nanjing University, China
Hui Zhang
Southeast University, China